The University of Liverpool, Liverpool, United Kingdom
Cockcroft Institute, Warrington, Cheshire, United Kingdom
FH Aachen, Jülich, Germany
The development work of a high-resolution quantum gas jet beam profile monitor for highly energetic sub-mm particle beams is in progress at the Cockcroft Institute (CI), UK. This device is designed on the principle of detecting the secondary ions from the ionisation induced in the interaction between the quantum gas jet and charged particle beams. This monitor aims to generate an intense gas jet with a diameter of less than 100 µm, which can ultimately lead to superior position resolution and high signal intensity resulting from a strongly focused quantum gas jet. This is done by exploiting the quantum wave feature of the neutral gas atoms to generate an interference pattern with a single maximum acting as an ultra-thin gas jet using an ’atom sieve’ which is similar to the light focusing with a Fresnel zone plate. This device will be minimally interceptive and will work analogously to a mechanical wire scanner. This contribution gives a general overview of the design, working principle of the monitor and experimental results obtained from the electron beam profile measurements carried out at the Cockcroft Institute.
