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BiBTeX citation export for THPOGE10: RF Characterisation of Bulk Niobium and Thin Film Coated Planar Samples at 7.8 GHz

@inproceedings{seal:linac2022-thpoge10,
  author       = {D.J. Seal and G. Burt and E. Chyhyrynets and O. Hryhorenko and D. Longuevergne and O.B. Malyshev and H.S. Marks and E.A. Marshall and C. Pira and B.S. Sian and R. Valizadeh},
% author       = {D.J. Seal and G. Burt and E. Chyhyrynets and O. Hryhorenko and D. Longuevergne and O.B. Malyshev and others},
% author       = {D.J. Seal and others},
  title        = {{RF Characterisation of Bulk Niobium and Thin Film Coated Planar Samples at 7.8 GHz}},
  booktitle    = {Proc. LINAC'22},
% booktitle    = {Proc. 31st International Linear Accelerator Conference (LINAC'22)},
  pages        = {818--821},
  eid          = {THPOGE10},
  language     = {english},
  keywords     = {cavity, SRF, site, operation, superconducting-RF},
  venue        = {Liverpool, UK},
  series       = {International Linear Accelerator Conference},
  number       = {31},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {09},
  year         = {2022},
  issn         = {2226-0366},
  isbn         = {978-3-95450-215-8},
  doi          = {10.18429/JACoW-LINAC2022-THPOGE10},
  url          = {https://jacow.org/linac2022/papers/thpoge10.pdf},
  abstract     = {{Research is ongoing into the use of superconducting thin films to replace bulk niobium for future radio frequency (RF) cavities. A key part of this research requires measuring the RF properties of candidate films. However, coating and testing thin films on full-sized cavities is both costly and time-consuming. Instead, films are typically deposited on small, flat samples and characterised using a test cavity. A cost-effective facility for testing such samples has recently been built and commissioned at Daresbury Laboratory. The facility allows for low power surface resistance measurements at a resonant frequency of 7.8 GHz, temperatures down to 4 K and sample surface magnetic fields up to 1 mT. A brief overview of this facility as well as recent results from measurements of both bulk Nb and thin film coated samples will be presented.}},
}